Selected Journal Papers--Quality Engineering
- H.-P. Lu and C.-T. Su (2021), “CNNs Combined with a Conditional GAN for Mura Defect Classification in TFT-LCDs,” IEEE Transactions on Semiconductor Manufacturing, Vol. 34, No. 1, pp. 25-33.
- H.-P. Lu, C.-T. Su, S.-Y. Yang and Y.-P. Lin (2020), “Combination of Convolutional and Generative Adversarial Networks for Defect Image Demoiréing of Thin-Film Transistor Liquid-Crystal Display Images,” IEEE Transactions on Semiconductor Manufacturing, Vol. 33, No. 3, pp. 413-423
- F.-M. Su and C.-T. Su (2020), “TFT-LCD Contrast Ratio Improvement by Using Design for Six Sigma Disciplines,” IEEE Transactions on Semiconductor Manufacturing, Vol. 33, No. 1, pp. 128-139.
- C.-T. Su, F.-M. Su, T.-Y. Chen and L.-F. Chen (2019), “Enhancing The Structural Strength of an Odd Laptop via Six Sigma Approach,” IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 9, No. 11, pp. 2200-2209.
- C.-T. Su and F.-M. Su (2018), “Yield Improvement in Color Filter Manufacturing Using Taguchi Methods and TRIZ’s Substance-Field Analysis,” IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 8, No. 12, pp. 2198-2212.
- C.-T. Su, C.-C. Hsu, T. Yang and H.-P. Hsu (2017), “Optimization of Solder Volume in Printed Circuit Board Assembly through Operating Window Experiment—A Case Study,” Experimental Techniques, Vol. 41, No. 3, pp. 309-316.
- C.-T. Su, H.-C. Lin, P.-W. Teng and T. Yang (2014), “Improving the Reliability of Electronic Paper Display Using FMEA and Taguchi Methods: A Case Study,” Microelectronics Reliability, Vol. 54, Nos. 6-7, pp. 1369-1377.
- C.-T. Su, Y.-H. Hsiao and C.-C. Chang (2012), "Parameter Optimization Design for Touch Panel Laser Cutting Process," IEEE Transactions on Automation Science and Engineering, Vol. 9, No. 2, pp. 320-329.
- C.-T. Su, C.-M. Lin and C.-C. Hsu (2012), "Optimization of the Optical Whiteness Ratio for Flexible Display by Using Taguchi’s Dynamic Approach," IEEE Transactions on Semiconductor Manufacturing, Vol. 25, No. 1, pp. 2-15.
- C.-T. Su, Y.-H. Hsiao and Y.-L. Liu (2012), "Enhancing the Fracture Resistance of Medium/Small-sized TFT-LCD using Six Sigma Methodology," IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 2, No. 1, pp. 149-164.
- C.-C. Hsu and C.-T. Su (2011), "An Adaptive Forecast-Based Chart for Non-Gaussian Processes Monitoring: With Application to Equipment Malfunctions Detection in a Thermal Power Plant," IEEE Transactions on Control Systems Technology, Vol. 19, No. 5, pp. 1245-1250.
- Y.-H. Hsiao and C.-T. Su (2009), "Multi-class MTS for Saxophone Timbre Quality Inspection Using Waveform Shape-based Features," IEEE Transactions on Systems, Man, and Cybernetics, Part B: Cybernetics, Vol. 39, No. 3, pp. 690-704.
- C.-T. Su, C.-J. Chou and L.-F. Chen (2009), "Application of Six Sigma Methodology to Optimize the Performance of the Inter-Metal Dielectric Process," IEEE Transactions on Semiconductor Manufacturing, Vol. 22, No. 2, pp. 297-304.
- C.-T. Su and Y.-H. Hsiao (2009), "Multi-class MTS for Simultaneous Feature Selection and Classification," IEEE Transactions on Knowledge and Data Engineering, Vol. 21, No. 2, pp. 192-205.
- L.-F. Chen, C.-T. Su and M.-H. Chen (2009), "A Neural-Network Approach for Defect Recognition in TFT-LCD Photolithography Process," IEEE Transactions on Electronics Packaging Manufacturing, Vol. 32, No. 1, pp. 1-8.
- C.-T. Su and Y.-H. Hsiao (2007), "An Evaluation of the Robustness of MTS for Imbalanced Data," IEEE Transactions on Knowledge and Data Engineering, Vol. 19, No. 10, pp. 1321-1332.
- C.-T. Su and C.-H. Yang (2006), "Two-Phased Meta-Heuristic Methods for the Post-Mapping Yield Control Problem," International Journal of Production Research, Vol. 44, No. 22, pp. 4837-4854.
- C.-T. Su, M.-C. Chen and H.-L. Chan (2005), "Applying Neural Network and Scatter Search to Optimize Parameter Design with Dynamic Characteristics," Journal of the Operational Research Society, Vol. 56, No. 10, pp. 1132-1140.
- M.-C. Chen, C.-T. Su, C.-C. Hsu and Y.-W. Liu (2005), "Data Transformation in SPC for Semiconductor Machinery Control: a Case of Monitoring Particles," International Journal of Production Research Vol. 43, No. 13, pp. 2759-2773.
- C.-T. Su, P.-S., Wang and C.-C. Hsu (2005), "Effective Approaches for Low Temperature Poly Silicon TFT LCD Post-mapping Yield Control Problem," IEEE Transactions on Automation Science and Engineering, Vol. 2, No. 2, pp. 198-206.
- C.-T. Su, T.-L. Chiang and K. Chiao (2005), "Optimizing IC Delamination Quality via Six Sigma Approach," IEEE Transactions on Electronics Packaging Manufacturing, Vol. 28, No. 3, pp. 241-248.
- C.-T. Su and C.-C. Hsu (2004), "A Time-Varying Weights Tuning Method of the Double EWMA Controller," OMEGA—The International Journal of Management Science, Vol. 32, No. 6, pp. 473-480.
- C.-T. Su and C.-C. Hsu (2004), "On-line Tuning of Single EWMA Controller Based on the Neural Technique," International Journal of Production Research, Vol. 42, No. 11, pp. 2163-2178.
- T.-L. Chiang and C.-T. Su (2003), "Optimization of TQFP Molding Process Using Neuro-fuzzy-GA Approach," European Journal of Operational Research, Vol. 147, No. 1, pp. 156-164.
- C.-T. Su, T. Yang and C.-M. Ke (2002), "A Neural-Network Approach for Semiconductor Wafer Post-Sawing Inspection," IEEE Transactions on Semiconductor Manufacturing, Vol. 15, No. 2, pp. 260-266.
- C.-T. Su and T.-L. Chiang (2002), "Optimal Design for a Ball Grid Array Wire Bonding Process Using a Neuro-Genetic Approach," IEEE Transactions on Electronics Packaging Manufacturing, Vol. 25, No. 1, pp. 13-18.
- C.-T. Su and M.-C. Chen (1999), "Computer-Aided Optimization of Multi-Pass Turning Operations for Continuous Forms on CNC Lathes," IIE Transactions, Vol. 31, No. 7, pp. 583-596.